TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_42_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-010-019-09 | FUSED_ID : 6359364768388653369
  IC_TEMP :  -56.69 | VDDM : 1132.26 | AUX_INT :   -5.08 | CsaBias :   55.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.51015e-04 / 2
  ADC_P0  : -5.07737e-03 ± 1.85329e-02
  ADC_P1  : 8.65081e-03 ± 4.77397e-04
  ADC_P2  : -6.21633e-06 ± 2.41350e-06
  CSA_Chi2/NDF : 1.07591e-04 / 2
  CSA_P0  : 5.84323e-02 ± 6.91848e-03
  CSA_P1  : 9.72280e-03 ± 5.21257e-04
  CSA_P2  : -4.65625e-05 ± 7.93813e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [12, 13, 34, 38, 39, 58, 59, 69, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 36, 77, 80, 90, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3824', '1.800', '0.1599', '1.800', '0.0989', '7.000', '0.7083', 1, 1, 1, 1, 1724881352.3223572]
VI_after__Init : ['1.201', '0.3823', '1.800', '0.1600', '1.800', '0.0912', '7.000', '0.7074', 1, 1, 1, 1, 1724881360.418733]
VI_at__the_End : ['1.201', '0.4805', '1.800', '0.1378', '1.803', '0.1118', '7.000', '0.7082', 1, 1, 1, 1, 1724881424.7651796]