TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_48_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-010-023-09 | FUSED_ID : 6359364768388653433
  IC_TEMP :  -55.75 | VDDM : 1126.70 | AUX_INT :   -7.63 | CsaBias :   58.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04289e-03 / 2
  ADC_P0  : -7.63195e-03 ± 2.18652e-02
  ADC_P1  : 8.33126e-03 ± 5.35988e-04
  ADC_P2  : -5.71404e-06 ± 2.60167e-06
  CSA_Chi2/NDF : 9.84724e-05 / 2
  CSA_P0  : 5.78957e-02 ± 6.61881e-03
  CSA_P1  : 9.81241e-03 ± 4.98679e-04
  CSA_P2  : -4.63991e-05 ± 7.59429e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 46, 55, 79, 104, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [44, 45, 46, 70, 89, 90, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1458', '1.800', '0.1259', '1.800', '0.0808', '7.000', '0.7072', 1, 1, 1, 1, 1724881736.095493]
VI_after__Init : ['1.201', '0.1457', '1.800', '0.1259', '1.800', '0.0751', '7.000', '0.7072', 1, 1, 1, 1, 1724881744.1870244]
VI_at__the_End : ['1.201', '0.4884', '1.800', '0.1368', '1.803', '0.1104', '7.000', '0.7078', 1, 1, 1, 1, 1724881808.5642242]