TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_50_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-010-024-09 | FUSED_ID : 6359364768388653449
  IC_TEMP :  -55.78 | VDDM : 1126.31 | AUX_INT :   -9.57 | CsaBias :   76.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41350e-03 / 2
  ADC_P0  : -9.56851e-03 ± 2.54527e-02
  ADC_P1  : 8.63457e-03 ± 6.34322e-04
  ADC_P2  : -6.48473e-06 ± 3.14488e-06
  CSA_Chi2/NDF : 1.18666e-04 / 2
  CSA_P0  : 5.98382e-02 ± 7.26582e-03
  CSA_P1  : 9.97575e-03 ± 5.47427e-04
  CSA_P2  : -4.62777e-05 ± 8.33667e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [45, 68, 70, 74, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [3, 34, 37, 97, 112, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2892', '1.800', '0.1636', '1.800', '0.0866', '7.000', '0.7071', 1, 1, 1, 1, 1724881831.60248]
VI_after__Init : ['1.201', '0.2893', '1.800', '0.1635', '1.802', '0.0810', '7.000', '0.7076', 1, 1, 1, 1, 1724881839.7799506]
VI_at__the_End : ['1.201', '0.5007', '1.800', '0.1391', '1.802', '0.1115', '7.000', '0.7078', 1, 1, 1, 1, 1724881897.1526823]