TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_30_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-006-03 | FUSED_ID : 6359364768388657251
  IC_TEMP :  -56.91 | VDDM : 1128.42 | AUX_INT :   -7.97 | CsaBias :   78.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08536e-03 / 2
  ADC_P0  : -7.97482e-03 ± 2.23113e-02
  ADC_P1  : 8.66270e-03 ± 5.69117e-04
  ADC_P2  : -6.02182e-06 ± 2.88107e-06
  CSA_Chi2/NDF : 1.59038e-04 / 2
  CSA_P0  : 6.04005e-02 ± 8.41149e-03
  CSA_P1  : 1.01000e-02 ± 6.33745e-04
  CSA_P2  : -5.01520e-05 ± 9.65118e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [27, 52, 77, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [38, 66, 110, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3919', '1.800', '0.1594', '1.800', '0.0992', '7.000', '0.7079', 1, 1, 1, 1, 1724884226.4232569]
VI_after__Init : ['1.201', '0.3921', '1.800', '0.1595', '1.800', '0.0935', '7.000', '0.7077', 1, 1, 1, 1, 1724884235.2105672]
VI_at__the_End : ['1.201', '0.4923', '1.800', '0.1401', '1.802', '0.1129', '7.000', '0.7083', 1, 1, 1, 1, 1724884288.5483737]