TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_27_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-008-03 | FUSED_ID : 6359364768388657283
  IC_TEMP :  -52.30 | VDDM : 1128.37 | AUX_INT :   -8.96 | CsaBias :   69.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36068e-03 / 2
  ADC_P0  : -8.96112e-03 ± 2.50009e-02
  ADC_P1  : 8.75313e-03 ± 6.39995e-04
  ADC_P2  : -6.27197e-06 ± 3.25556e-06
  CSA_Chi2/NDF : 1.23481e-04 / 2
  CSA_P0  : 6.08953e-02 ± 7.41179e-03
  CSA_P1  : 1.00740e-02 ± 5.58425e-04
  CSA_P2  : -5.01454e-05 ± 8.50415e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 45, 66, 69, 75, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [17, 64, 88, 118, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4543', '1.800', '0.1624', '1.800', '0.0980', '7.000', '0.7079', 1, 1, 1, 1, 1724884034.6818793]
VI_after__Init : ['1.201', '0.4550', '1.800', '0.1625', '1.803', '0.0922', '7.000', '0.7077', 1, 1, 1, 1, 1724884043.002382]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1366', '1.800', '0.1121', '7.000', '0.7086', 1, 1, 1, 1, 1724884102.3467777]