TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_25_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-009-03 | FUSED_ID : 6359364768388657299
  IC_TEMP :  -53.77 | VDDM : 1128.31 | AUX_INT :  -10.03 | CsaBias :   82.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48018e-03 / 2
  ADC_P0  : -1.00325e-02 ± 2.60540e-02
  ADC_P1  : 8.46164e-03 ± 6.40075e-04
  ADC_P2  : -5.81778e-06 ± 3.14441e-06
  CSA_Chi2/NDF : 1.15641e-04 / 2
  CSA_P0  : 5.86726e-02 ± 7.17264e-03
  CSA_P1  : 9.93556e-03 ± 5.40406e-04
  CSA_P2  : -4.77449e-05 ± 8.22975e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [13, 29, 32, 92, 95, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [9, 18, 19, 32, 55, 68, 88, 92, 103, 121, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4436', '1.800', '0.1522', '1.800', '0.0976', '7.000', '0.7085', 1, 1, 1, 1, 1724883938.5324202]
VI_after__Init : ['1.201', '0.4439', '1.800', '0.1523', '1.800', '0.0900', '7.000', '0.7076', 1, 1, 1, 1, 1724883947.4386692]
VI_at__the_End : ['1.201', '0.4899', '1.800', '0.1391', '1.799', '0.1095', '7.000', '0.7085', 1, 1, 1, 1, 1724884010.0938628]