TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_22_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-011-03 | FUSED_ID : 6359364768388657331
  IC_TEMP :  -56.34 | VDDM : 1130.71 | AUX_INT :   -7.78 | CsaBias :   62.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13097e-03 / 2
  ADC_P0  : -7.77675e-03 ± 2.27760e-02
  ADC_P1  : 8.84810e-03 ± 5.91643e-04
  ADC_P2  : -6.54109e-06 ± 3.04121e-06
  CSA_Chi2/NDF : 1.91038e-04 / 2
  CSA_P0  : 6.19814e-02 ± 9.21896e-03
  CSA_P1  : 1.03677e-02 ± 6.94582e-04
  CSA_P2  : -5.59073e-05 ± 1.05777e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 50, 75, 77, 78, 80, 105, 111, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [9, 25, 44, 50, 62, 68, 70, 99, 107, 109, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1546', '1.800', '0.1774', '1.800', '0.0831', '7.000', '0.7076', 1, 1, 1, 1, 1724883747.4330707]
VI_after__Init : ['1.201', '0.1547', '1.800', '0.1775', '1.800', '0.0774', '7.000', '0.7077', 1, 1, 1, 1, 1724883755.6314075]
VI_at__the_End : ['1.201', '0.4918', '1.800', '0.1406', '1.800', '0.1143', '7.000', '0.7083', 1, 1, 1, 1, 1724883813.008958]