TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_14_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-016-04 | FUSED_ID : 6359364768388657412
  IC_TEMP :  -52.97 | VDDM : 1116.10 | AUX_INT :   -7.37 | CsaBias :   78.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01931e-03 / 2
  ADC_P0  : -7.37024e-03 ± 2.16387e-02
  ADC_P1  : 8.61028e-03 ± 5.55089e-04
  ADC_P2  : -5.61376e-06 ± 2.82372e-06
  CSA_Chi2/NDF : 1.50402e-04 / 2
  CSA_P0  : 6.16347e-02 ± 8.17993e-03
  CSA_P1  : 1.03223e-02 ± 6.16298e-04
  CSA_P2  : -5.24593e-05 ± 9.38550e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [2, 17, 27, 42, 48, 60, 81]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [6, 18, 41, 63, 89, 93, 104, 111, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3421', '1.800', '0.1356', '1.800', '0.0989', '7.000', '0.7081', 1, 1, 1, 1, 1724883273.084969]
VI_after__Init : ['1.200', '0.3421', '1.800', '0.1357', '1.802', '0.0915', '7.000', '0.7074', 1, 1, 1, 1, 1724883281.9362144]
VI_at__the_End : ['1.201', '0.4994', '1.800', '0.1415', '1.801', '0.1114', '7.000', '0.7081', 1, 1, 1, 1, 1724883336.4100003]