TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_12_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-017-04 | FUSED_ID : 6359364768388657428
  IC_TEMP :  -52.85 | VDDM : 1128.61 | AUX_INT :   -8.24 | CsaBias :   74.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06913e-03 / 2
  ADC_P0  : -8.24055e-03 ± 2.21287e-02
  ADC_P1  : 8.35237e-03 ± 5.41267e-04
  ADC_P2  : -5.74395e-06 ± 2.62969e-06
  CSA_Chi2/NDF : 1.16648e-04 / 2
  CSA_P0  : 5.95959e-02 ± 7.20379e-03
  CSA_P1  : 9.77340e-03 ± 5.42753e-04
  CSA_P2  : -4.69417e-05 ± 8.26549e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [5, 10, 11, 50, 54, 67, 109, 114, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [15, 22, 36, 85, 103, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2863', '1.800', '0.1445', '1.800', '0.0825', '7.000', '0.7073', 1, 1, 1, 1, 1724883176.964245]
VI_after__Init : ['1.201', '0.2868', '1.800', '0.1446', '1.800', '0.0768', '7.000', '0.7072', 1, 1, 1, 1, 1724883185.8156512]
VI_at__the_End : ['1.201', '0.4832', '1.800', '0.1372', '1.800', '0.1129', '7.000', '0.7083', 1, 1, 1, 1, 1724883247.2148912]