TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_09_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-019-04 | FUSED_ID : 6359364768388657460
  IC_TEMP :  -58.89 | VDDM : 1126.84 | AUX_INT :   -7.67 | CsaBias :   61.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11354e-03 / 2
  ADC_P0  : -7.67294e-03 ± 2.25845e-02
  ADC_P1  : 8.68696e-03 ± 5.72249e-04
  ADC_P2  : -6.59299e-06 ± 2.86362e-06
  CSA_Chi2/NDF : 1.55654e-04 / 2
  CSA_P0  : 5.94823e-02 ± 8.32153e-03
  CSA_P1  : 9.84415e-03 ± 6.26967e-04
  CSA_P2  : -4.88987e-05 ± 9.54797e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 32, 68, 71, 73, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [24, 29, 66, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3868', '1.800', '0.1501', '1.799', '0.0953', '7.000', '0.7071', 1, 1, 1, 1, 1724882985.1397223]
VI_after__Init : ['1.201', '0.3869', '1.800', '0.1502', '1.800', '0.0894', '7.000', '0.7070', 1, 1, 1, 1, 1724882993.2062075]
VI_at__the_End : ['1.201', '0.4837', '1.800', '0.1393', '1.803', '0.1126', '7.000', '0.7080', 1, 1, 1, 1, 1724883055.652439]