TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_06_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-021-04 | FUSED_ID : 6359364768388657492
  IC_TEMP :  -57.75 | VDDM : 1128.99 | AUX_INT :   -9.48 | CsaBias :   75.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28743e-03 / 2
  ADC_P0  : -9.47539e-03 ± 2.42617e-02
  ADC_P1  : 8.59084e-03 ± 6.01149e-04
  ADC_P2  : -6.37686e-06 ± 2.96894e-06
  CSA_Chi2/NDF : 1.35178e-04 / 2
  CSA_P0  : 6.05008e-02 ± 7.75489e-03
  CSA_P1  : 1.02208e-02 ± 5.84275e-04
  CSA_P2  : -5.22066e-05 ± 8.89782e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 22, 29, 77, 119, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [32, 85, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3071', '1.800', '0.1323', '1.800', '0.0928', '7.000', '0.7069', 1, 1, 1, 1, 1724882792.0583966]
VI_after__Init : ['1.201', '0.3073', '1.800', '0.1324', '1.801', '0.0870', '7.000', '0.7070', 1, 1, 1, 1, 1724882800.8238182]
VI_at__the_End : ['1.201', '0.4932', '1.800', '0.1388', '1.803', '0.1156', '7.000', '0.7078', 1, 1, 1, 1, 1724882863.0140169]