TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_03_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-023-04 | FUSED_ID : 6359364768388657524
  IC_TEMP :  -52.91 | VDDM : 1128.22 | AUX_INT :   -8.10 | CsaBias :   67.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06391e-03 / 2
  ADC_P0  : -8.09894e-03 ± 2.20820e-02
  ADC_P1  : 8.50190e-03 ± 5.51456e-04
  ADC_P2  : -5.87646e-06 ± 2.73428e-06
  CSA_Chi2/NDF : 1.62557e-04 / 2
  CSA_P0  : 5.89465e-02 ± 8.50403e-03
  CSA_P1  : 1.02302e-02 ± 6.40717e-04
  CSA_P2  : -5.18108e-05 ± 9.75736e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [12, 16, 32, 86, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [17, 26, 60, 68, 74, 86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3101', '1.800', '0.1507', '1.799', '0.0877', '7.000', '0.7068', 1, 1, 1, 1, 1724882600.665873]
VI_after__Init : ['1.201', '0.3103', '1.800', '0.1509', '1.801', '0.0821', '7.000', '0.7069', 1, 1, 1, 1, 1724882608.792273]
VI_at__the_End : ['1.201', '0.4957', '1.800', '0.1385', '1.808', '0.1120', '7.000', '0.7076', 1, 1, 1, 1, 1724882664.935097]