TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_01_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-024-04 | FUSED_ID : 6359364768388657540
  IC_TEMP :  -53.76 | VDDM : 1119.26 | AUX_INT :   -8.08 | CsaBias :   66.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35973e-03 / 2
  ADC_P0  : -8.07699e-03 ± 2.50497e-02
  ADC_P1  : 8.35456e-03 ± 6.27107e-04
  ADC_P2  : -4.98246e-06 ± 3.11911e-06
  CSA_Chi2/NDF : 1.80355e-04 / 2
  CSA_P0  : 5.99419e-02 ± 8.95750e-03
  CSA_P1  : 1.04646e-02 ± 6.74883e-04
  CSA_P2  : -5.42667e-05 ± 1.02777e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 2, 11, 12, 69, 88, 97, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [2, 41, 44, 64, 120, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3189', '1.800', '0.1832', '1.800', '0.0876', '7.000', '0.7067', 1, 1, 1, 1, 1724882504.9491212]
VI_after__Init : ['1.201', '0.3190', '1.800', '0.1834', '1.800', '0.0823', '7.000', '0.7069', 1, 1, 1, 1, 1724882513.044508]
VI_at__the_End : ['1.201', '0.5004', '1.800', '0.1397', '1.806', '0.1130', '7.000', '0.7075', 1, 1, 1, 1, 1724882575.65885]