TEST_NAME : Wafer
TEST_DATE : 24_08_28-23_58_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-011-026-04 | FUSED_ID : 6359364768388657572
  IC_TEMP :  -52.98 | VDDM : 1126.29 | AUX_INT :   -6.51 | CsaBias :   85.07
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.92441e-04 / 2
  ADC_P0  : -6.50573e-03 ± 1.90516e-02
  ADC_P1  : 8.38640e-03 ± 4.75187e-04
  ADC_P2  : -5.56265e-06 ± 2.34283e-06
  CSA_Chi2/NDF : 1.22456e-04 / 2
  CSA_P0  : 5.84259e-02 ± 7.38095e-03
  CSA_P1  : 9.85964e-03 ± 5.56101e-04
  CSA_P2  : -4.53214e-05 ± 8.46877e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [10, 50, 70, 76, 81, 98, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [22, 30, 38, 40, 55, 57, 70, 92, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4115', '1.800', '0.1479', '1.800', '0.0871', '7.000', '0.7069', 1, 1, 1, 1, 1724882312.293709]
VI_after__Init : ['1.201', '0.4116', '1.800', '0.1479', '1.802', '0.0814', '7.000', '0.7065', 1, 1, 1, 1, 1724882320.3920348]
VI_at__the_End : ['1.201', '0.4957', '1.800', '0.1372', '1.800', '0.1115', '7.000', '0.7079', 1, 1, 1, 1, 1724882375.9117918]