TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_38_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-002-11 | FUSED_ID : 6359364768388661291
  IC_TEMP :  -53.20 | VDDM : 1121.51 | AUX_INT :   -7.97 | CsaBias :   78.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08536e-03 / 2
  ADC_P0  : -7.97482e-03 ± 2.23113e-02
  ADC_P1  : 8.66270e-03 ± 5.69117e-04
  ADC_P2  : -6.02182e-06 ± 2.88107e-06
  CSA_Chi2/NDF : 1.77804e-04 / 2
  CSA_P0  : 5.67656e-02 ± 8.89392e-03
  CSA_P1  : 9.66385e-03 ± 6.70093e-04
  CSA_P2  : -4.46021e-05 ± 1.02047e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [1, 75, 104, 106, 108, 110, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 10, 27, 44, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3296', '1.800', '0.1430', '1.799', '0.0938', '7.000', '0.7083', 1, 1, 1, 1, 1724884707.2614338]
VI_after__Init : ['1.201', '0.3298', '1.800', '0.1430', '1.802', '0.0863', '7.000', '0.7073', 1, 1, 1, 1, 1724884715.44077]
VI_at__the_End : ['1.201', '0.4840', '1.800', '0.1372', '1.799', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1724884779.2428265]