TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_52_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-011-11 | FUSED_ID : 6359364768388661435
  IC_TEMP :  -54.76 | VDDM : 1116.42 | AUX_INT :   -7.18 | CsaBias :   72.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05896e-03 / 2
  ADC_P0  : -7.18221e-03 ± 2.20894e-02
  ADC_P1  : 7.96797e-03 ± 5.31758e-04
  ADC_P2  : -4.36258e-06 ± 2.54013e-06
  CSA_Chi2/NDF : 1.78667e-04 / 2
  CSA_P0  : 5.88532e-02 ± 8.91546e-03
  CSA_P1  : 1.01598e-02 ± 6.71716e-04
  CSA_P2  : -5.44515e-05 ± 1.02294e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [47, 67, 78, 80, 81, 106, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 18, 19, 46, 64, 91, 108, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4092', '1.800', '0.1749', '1.800', '0.0985', '7.000', '0.7067', 1, 1, 1, 1, 1724885571.4843097]
VI_after__Init : ['1.201', '0.4093', '1.800', '0.1750', '1.800', '0.0930', '7.000', '0.7068', 1, 1, 1, 1, 1724885580.2317479]
VI_at__the_End : ['1.202', '0.4780', '1.800', '0.1469', '1.799', '0.1125', '7.000', '0.7074', 1, 1, 1, 1, 1724885642.1997893]