TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_56_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-013-11 | FUSED_ID : 6359364768388661467
  IC_TEMP :  -52.68 | VDDM : 1127.92 | AUX_INT :   -8.76 | CsaBias :   82.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25637e-03 / 2
  ADC_P0  : -8.76245e-03 ± 2.40321e-02
  ADC_P1  : 8.37791e-03 ± 5.95009e-04
  ADC_P2  : -5.33349e-06 ± 2.93448e-06
  CSA_Chi2/NDF : 1.40219e-04 / 2
  CSA_P0  : 6.23037e-02 ± 7.89816e-03
  CSA_P1  : 1.04181e-02 ± 5.95069e-04
  CSA_P2  : -5.31041e-05 ± 9.06220e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 22, 44, 83, 88, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [14, 95, 100, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4574', '1.800', '0.1569', '1.800', '0.0985', '7.000', '0.7069', 1, 1, 1, 1, 1724885764.0690415]
VI_after__Init : ['1.201', '0.4576', '1.800', '0.1569', '1.801', '0.0927', '7.000', '0.7069', 1, 1, 1, 1, 1724885772.2575002]
VI_at__the_End : ['1.202', '0.5038', '1.800', '0.1418', '1.803', '0.1110', '7.000', '0.7078', 1, 1, 1, 1, 1724885834.413559]