TEST_NAME : Wafer
TEST_DATE : 24_08_29-00_59_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-015-11 | FUSED_ID : 6359364768388661499
  IC_TEMP :  -56.91 | VDDM : 1108.85 | AUX_INT :   -8.23 | CsaBias :   76.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09595e-03 / 2
  ADC_P0  : -8.22826e-03 ± 2.24120e-02
  ADC_P1  : 8.51267e-03 ± 5.59698e-04
  ADC_P2  : -5.90023e-06 ± 2.77514e-06
  CSA_Chi2/NDF : 1.34324e-04 / 2
  CSA_P0  : 5.92594e-02 ± 7.73034e-03
  CSA_P1  : 9.95140e-03 ± 5.82425e-04
  CSA_P2  : -4.99364e-05 ± 8.86965e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [10, 47, 70, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 26, 47, 62, 75, 102, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2574', '1.800', '0.1342', '1.800', '0.0870', '7.000', '0.7072', 1, 1, 1, 1, 1724885955.948052]
VI_after__Init : ['1.202', '0.2573', '1.800', '0.1342', '1.801', '0.0816', '7.000', '0.7071', 1, 1, 1, 1, 1724885964.2313848]
VI_at__the_End : ['1.201', '0.4848', '1.800', '0.1382', '1.799', '0.1137', '7.000', '0.7078', 1, 1, 1, 1, 1724886019.2841327]