TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_00_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-016-12 | FUSED_ID : 6359364768388661516
  IC_TEMP :  -55.08 | VDDM : 1123.85 | AUX_INT :   -8.55 | CsaBias :   73.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21515e-03 / 2
  ADC_P0  : -8.54755e-03 ± 2.36189e-02
  ADC_P1  : 8.22964e-03 ± 5.71021e-04
  ADC_P2  : -5.41393e-06 ± 2.74448e-06
  CSA_Chi2/NDF : 8.42139e-05 / 2
  CSA_P0  : 5.81038e-02 ± 6.12089e-03
  CSA_P1  : 9.29653e-03 ± 4.61165e-04
  CSA_P2  : -4.33957e-05 ± 7.02299e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [0, 5, 33, 38, 40, 46, 74, 107, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [35, 41, 46, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1731', '1.800', '0.1319', '1.800', '0.0842', '7.000', '0.7072', 1, 1, 1, 1, 1724886051.9625316]
VI_after__Init : ['1.201', '0.1729', '1.800', '0.1319', '1.801', '0.0788', '7.000', '0.7071', 1, 1, 1, 1, 1724886060.2109382]
VI_at__the_End : ['1.201', '0.4679', '1.800', '0.1359', '1.800', '0.1104', '7.000', '0.7080', 1, 1, 1, 1, 1724886122.9870217]