TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_02_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-017-12 | FUSED_ID : 6359364768388661532
  IC_TEMP :  -57.51 | VDDM : 1125.93 | AUX_INT :   -8.26 | CsaBias :   67.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08160e-03 / 2
  ADC_P0  : -8.25984e-03 ± 2.22721e-02
  ADC_P1  : 8.49282e-03 ± 5.58059e-04
  ADC_P2  : -5.60366e-06 ± 2.78287e-06
  CSA_Chi2/NDF : 1.40473e-04 / 2
  CSA_P0  : 5.81451e-02 ± 7.90532e-03
  CSA_P1  : 9.94857e-03 ± 5.95609e-04
  CSA_P2  : -5.14032e-05 ± 9.07042e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [20, 26, 35, 84, 110, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [19, 42, 65, 67, 71, 75, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2988', '1.800', '0.1616', '1.800', '0.0929', '7.000', '0.7072', 1, 1, 1, 1, 1724886148.2020285]
VI_after__Init : ['1.201', '0.2974', '1.800', '0.1613', '1.801', '0.0875', '7.000', '0.7072', 1, 1, 1, 1, 1724886156.4592602]
VI_at__the_End : ['1.200', '0.4739', '1.800', '0.1394', '1.800', '0.1097', '7.000', '0.7079', 1, 1, 1, 1, 1724886218.4755971]