TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_05_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-019-12 | FUSED_ID : 6359364768388661564
  IC_TEMP :  -59.25 | VDDM : 1128.85 | AUX_INT :   -9.11 | CsaBias :   74.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33944e-03 / 2
  ADC_P0  : -9.11245e-03 ± 2.47874e-02
  ADC_P1  : 8.43688e-03 ± 6.08364e-04
  ADC_P2  : -5.96505e-06 ± 2.96938e-06
  CSA_Chi2/NDF : 1.28548e-04 / 2
  CSA_P0  : 5.83764e-02 ± 7.56232e-03
  CSA_P1  : 1.00518e-02 ± 5.69766e-04
  CSA_P2  : -5.02737e-05 ± 8.67686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 40, 68, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [23, 33, 67, 87, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4421', '1.800', '0.1701', '1.799', '0.1040', '7.000', '0.7082', 1, 1, 1, 1, 1724886340.1010811]
VI_after__Init : ['1.201', '0.4417', '1.800', '0.1704', '1.800', '0.0971', '7.000', '0.7075', 1, 1, 1, 1, 1724886348.236494]
VI_at__the_End : ['1.201', '0.4881', '1.800', '0.1417', '1.807', '0.1118', '7.000', '0.7082', 1, 1, 1, 1, 1724886409.4787235]