TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_10_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-022-12 | FUSED_ID : 6359364768388661612
  IC_TEMP :  -51.50 | VDDM : 1127.60 | AUX_INT :   -9.62 | CsaBias :   81.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51305e-03 / 2
  ADC_P0  : -9.62246e-03 ± 2.63831e-02
  ADC_P1  : 8.30530e-03 ± 6.42065e-04
  ADC_P2  : -5.41839e-06 ± 3.11743e-06
  CSA_Chi2/NDF : 1.17370e-04 / 2
  CSA_P0  : 6.06186e-02 ± 7.22605e-03
  CSA_P1  : 1.00977e-02 ± 5.44431e-04
  CSA_P2  : -4.77066e-05 ± 8.29104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 23, 28, 65, 103, 114, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [4, 27, 31, 62, 70, 88, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2363', '1.800', '0.1418', '1.800', '0.0886', '7.000', '0.7073', 1, 1, 1, 1, 1724886629.7226834]
VI_after__Init : ['1.202', '0.2363', '1.800', '0.1418', '1.800', '0.0829', '7.000', '0.7076', 1, 1, 1, 1, 1724886637.8110294]
VI_at__the_End : ['1.201', '0.5043', '1.800', '0.1392', '1.804', '0.1101', '7.000', '0.7083', 1, 1, 1, 1, 1724886699.7792568]