TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_12_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-023-12 | FUSED_ID : 6359364768388661628
  IC_TEMP :  -57.94 | VDDM : 1103.76 | AUX_INT :   -9.57 | CsaBias :   73.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53663e-03 / 2
  ADC_P0  : -9.56693e-03 ± 2.65798e-02
  ADC_P1  : 8.32635e-03 ± 6.44780e-04
  ADC_P2  : -5.73414e-06 ± 3.11324e-06
  CSA_Chi2/NDF : 1.36906e-04 / 2
  CSA_P0  : 6.00212e-02 ± 7.80429e-03
  CSA_P1  : 9.69408e-03 ± 5.87997e-04
  CSA_P2  : -4.69964e-05 ± 8.95450e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [5, 32, 105, 107, 111, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 16, 34, 36, 58]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3802', '1.800', '0.1728', '1.800', '0.0910', '7.000', '0.7076', 1, 1, 1, 1, 1724886725.549292]
VI_after__Init : ['1.201', '0.3803', '1.800', '0.1728', '1.800', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1724886733.726567]
VI_at__the_End : ['1.201', '0.4800', '1.800', '0.1403', '1.805', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1724886792.2460213]