TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_13_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-024-12 | FUSED_ID : 6359364768388661644
  IC_TEMP :  -55.67 | VDDM : 1122.21 | AUX_INT :   -9.11 | CsaBias :   66.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33944e-03 / 2
  ADC_P0  : -9.11245e-03 ± 2.47874e-02
  ADC_P1  : 8.43688e-03 ± 6.08364e-04
  ADC_P2  : -5.96505e-06 ± 2.96938e-06
  CSA_Chi2/NDF : 1.68068e-04 / 2
  CSA_P0  : 5.84397e-02 ± 8.64698e-03
  CSA_P1  : 9.90796e-03 ± 6.51488e-04
  CSA_P2  : -5.05579e-05 ± 9.92139e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 24, 62, 91, 123, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [31, 36, 40, 50, 56, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3160', '1.800', '0.1760', '1.800', '0.0950', '7.000', '0.7086', 1, 1, 1, 1, 1724886822.2487946]
VI_after__Init : ['1.201', '0.3159', '1.800', '0.1759', '1.800', '0.0875', '7.000', '0.7077', 1, 1, 1, 1, 1724886830.288129]
VI_at__the_End : ['1.201', '0.4800', '1.800', '0.1370', '1.804', '0.1125', '7.000', '0.7083', 1, 1, 1, 1, 1724886893.2552226]