TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_15_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-025-12 | FUSED_ID : 6359364768388661660
  IC_TEMP :  -56.92 | VDDM : 1132.07 | AUX_INT :   -7.35 | CsaBias :   66.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.82543e-04 / 2
  ADC_P0  : -7.34839e-03 ± 2.00837e-02
  ADC_P1  : 8.30019e-03 ± 4.88019e-04
  ADC_P2  : -5.85312e-06 ± 2.34708e-06
  CSA_Chi2/NDF : 1.44559e-04 / 2
  CSA_P0  : 5.81736e-02 ± 8.01947e-03
  CSA_P1  : 9.93884e-03 ± 6.04209e-04
  CSA_P2  : -4.51005e-05 ± 9.20139e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [33, 79]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 25, 42, 81, 107, 111, 116, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5055', '1.800', '0.1466', '1.800', '0.0880', '7.000', '0.7076', 1, 1, 1, 1, 1724886918.9343064]
VI_after__Init : ['1.201', '0.5060', '1.800', '0.1467', '1.801', '0.0821', '7.000', '0.7077', 1, 1, 1, 1, 1724886927.0297084]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1398', '1.800', '0.1109', '7.000', '0.7087', 1, 1, 1, 1, 1724886990.3548014]