TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_16_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-026-12 | FUSED_ID : 6359364768388661676
  IC_TEMP :  -52.98 | VDDM : 1126.74 | AUX_INT :   -7.54 | CsaBias :   76.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.47346e-04 / 2
  ADC_P0  : -7.53598e-03 ± 2.07918e-02
  ADC_P1  : 8.50113e-03 ± 5.11287e-04
  ADC_P2  : -6.55209e-06 ± 2.48334e-06
  CSA_Chi2/NDF : 1.21442e-04 / 2
  CSA_P0  : 5.87460e-02 ± 7.35034e-03
  CSA_P1  : 9.92312e-03 ± 5.53795e-04
  CSA_P2  : -4.52543e-05 ± 8.43364e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [19, 27, 46, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 35, 55, 66, 110, 116, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4815', '1.800', '0.1467', '1.800', '0.0985', '7.000', '0.7076', 1, 1, 1, 1, 1724887015.4538465]
VI_after__Init : ['1.202', '0.4819', '1.800', '0.1468', '1.800', '0.0926', '7.000', '0.7076', 1, 1, 1, 1, 1724887023.4602242]
VI_at__the_End : ['1.201', '0.5005', '1.800', '0.1376', '1.808', '0.1112', '7.000', '0.7086', 1, 1, 1, 1, 1724887078.8939066]