TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_18_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-012-027-12 | FUSED_ID : 6359364768388661692
  IC_TEMP :  -65.71 | VDDM : 1136.76 | AUX_INT : -157.99 | CsaBias :  -39.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10913e-03 / 2
  ADC_P0  : -1.57985e-01 ± 2.97340e-02
  ADC_P1  : 1.09021e-02 ± 7.07982e-04
  ADC_P2  : -1.42471e-05 ± 3.32277e-06
  CSA_Chi2/NDF : 1.65411e-04 / 2
  CSA_P0  : 5.78489e-02 ± 8.57836e-03
  CSA_P1  : 9.89366e-03 ± 6.46317e-04
  CSA_P2  : -4.76283e-05 ± 9.84265e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [13, 49, 57, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [13, 25, 28, 52, 74, 92, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2701', '1.800', '0.1210', '1.800', '0.0913', '7.000', '0.7078', 1, 1, 1, 1, 1724887111.1023688]
VI_after__Init : ['1.201', '0.2704', '1.800', '0.1209', '1.801', '0.0858', '7.000', '0.7076', 1, 1, 1, 1, 1724887119.2448454]
VI_at__the_End : ['1.201', '0.4876', '1.800', '0.1321', '1.801', '0.1123', '7.000', '0.7085', 1, 1, 1, 1, 1724887173.070638]