TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_55_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-013-004-06 | FUSED_ID : 6359364768388665414
  IC_TEMP :  -54.77 | VDDM : 1151.52 | AUX_INT : -193.26 | CsaBias :  -79.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.73995e-04 / 2
  ADC_P0  : -1.93261e-01 ± 2.68013e-02
  ADC_P1  : 1.15659e-02 ± 6.47776e-04
  ADC_P2  : -1.64471e-05 ± 3.05961e-06
  CSA_Chi2/NDF : 1.12083e-04 / 2
  CSA_P0  : 5.83012e-02 ± 7.06142e-03
  CSA_P1  : 9.54093e-03 ± 5.32027e-04
  CSA_P2  : -4.31238e-05 ± 8.10214e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [0, 38, 46, 56, 82, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [3, 9, 30, 41, 67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1358', '1.800', '0.1488', '1.799', '0.0805', '7.000', '0.7073', 1, 1, 1, 1, 1724889319.6775227]
VI_after__Init : ['1.201', '0.1358', '1.800', '0.1488', '1.799', '0.0754', '7.000', '0.7072', 1, 1, 1, 1, 1724889327.7689104]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1381', '1.800', '0.1110', '7.000', '0.7081', 1, 1, 1, 1, 1724889389.938195]