TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_50_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-013-007-06 | FUSED_ID : 6359364768388665462
  IC_TEMP :  -57.53 | VDDM : 1127.56 | AUX_INT :   -7.97 | CsaBias :   62.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.84277e-04 / 2
  ADC_P0  : -7.96967e-03 ± 2.11965e-02
  ADC_P1  : 8.85061e-03 ± 5.42431e-04
  ADC_P2  : -7.03008e-06 ± 2.74769e-06
  CSA_Chi2/NDF : 1.65053e-04 / 2
  CSA_P0  : 5.70074e-02 ± 8.56907e-03
  CSA_P1  : 9.95575e-03 ± 6.45617e-04
  CSA_P2  : -5.01128e-05 ± 9.83199e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 9, 11, 13, 77, 84, 90, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [95, 119, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3512', '1.800', '0.1330', '1.800', '0.0951', '7.000', '0.7076', 1, 1, 1, 1, 1724889031.7235126]
VI_after__Init : ['1.201', '0.3514', '1.800', '0.1331', '1.800', '0.0881', '7.000', '0.7072', 1, 1, 1, 1, 1724889039.9988341]
VI_at__the_End : ['1.201', '0.4808', '1.800', '0.1384', '1.803', '0.1119', '7.000', '0.7079', 1, 1, 1, 1, 1724889094.4547129]