TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_44_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-013-011-06 | FUSED_ID : 6359364768388665526
  IC_TEMP :  -44.67 | VDDM : 1130.57 | AUX_INT :   -7.30 | CsaBias :   84.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10661e-03 / 2
  ADC_P0  : -7.29810e-03 ± 2.25971e-02
  ADC_P1  : 8.41633e-03 ± 5.77811e-04
  ADC_P2  : -4.59670e-06 ± 2.93731e-06
  CSA_Chi2/NDF : 1.33874e-04 / 2
  CSA_P0  : 6.14578e-02 ± 7.71738e-03
  CSA_P1  : 9.88575e-03 ± 5.81449e-04
  CSA_P2  : -4.61039e-05 ± 8.85478e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [9, 39, 58, 75]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 7, 37, 56, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1852', '1.800', '0.1402', '1.799', '0.0835', '7.000', '0.7067', 1, 1, 1, 1, 1724888646.9977446]
VI_after__Init : ['1.201', '0.1851', '1.800', '0.1402', '1.800', '0.0781', '7.000', '0.7069', 1, 1, 1, 1, 1724888655.7690911]
VI_at__the_End : ['1.201', '0.4999', '1.800', '0.1409', '1.801', '0.1100', '7.000', '0.7075', 1, 1, 1, 1, 1724888717.7053258]