TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_36_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-013-016-01 | FUSED_ID : 6359364768388665601
  IC_TEMP :  -51.21 | VDDM : 1132.85 | AUX_INT :   -7.18 | CsaBias :   76.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12382e-03 / 2
  ADC_P0  : -7.17631e-03 ± 2.27650e-02
  ADC_P1  : 8.43025e-03 ± 5.80073e-04
  ADC_P2  : -4.91489e-06 ± 2.93156e-06
  CSA_Chi2/NDF : 1.30295e-04 / 2
  CSA_P0  : 5.98310e-02 ± 7.61354e-03
  CSA_P1  : 9.88227e-03 ± 5.73625e-04
  CSA_P2  : -4.68603e-05 ± 8.73563e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 19, 20, 35, 43, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [49, 80, 85, 118, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3492', '1.800', '0.1774', '1.799', '0.0905', '7.000', '0.7069', 1, 1, 1, 1, 1724888166.6951022]
VI_after__Init : ['1.201', '0.3494', '1.800', '0.1774', '1.802', '0.0852', '7.000', '0.7070', 1, 1, 1, 1, 1724888174.9496052]
VI_at__the_End : ['1.201', '0.4949', '1.800', '0.1401', '1.800', '0.1120', '7.000', '0.7075', 1, 1, 1, 1, 1724888227.6915698]