TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_32_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-013-018-01 | FUSED_ID : 6359364768388665633
  IC_TEMP :  -54.73 | VDDM : 1128.95 | AUX_INT :   -6.93 | CsaBias :   65.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07840e-03 / 2
  ADC_P0  : -6.93119e-03 ± 2.22995e-02
  ADC_P1  : 8.09906e-03 ± 5.47867e-04
  ADC_P2  : -4.41165e-06 ± 2.66985e-06
  CSA_Chi2/NDF : 1.43476e-04 / 2
  CSA_P0  : 6.07007e-02 ± 7.98935e-03
  CSA_P1  : 9.93382e-03 ± 6.01940e-04
  CSA_P2  : -4.91567e-05 ± 9.16684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 13, 63, 85, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [17, 51, 53, 102, 104, 111, 113, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4777', '1.800', '0.1728', '1.799', '0.1040', '7.000', '0.7072', 1, 1, 1, 1, 1724887974.424712]
VI_after__Init : ['1.201', '0.4780', '1.800', '0.1732', '1.801', '0.0985', '7.000', '0.7070', 1, 1, 1, 1, 1724887982.7899811]
VI_at__the_End : ['1.201', '0.4886', '1.800', '0.1377', '1.799', '0.1131', '7.000', '0.7078', 1, 1, 1, 1, 1724888044.267413]