TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_23_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-013-024-01 | FUSED_ID : 6359364768388665729
  IC_TEMP :  -53.29 | VDDM : 1136.38 | AUX_INT : -151.47 | CsaBias :  -37.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.17954e-04 / 2
  ADC_P0  : -1.51472e-01 ± 2.67477e-02
  ADC_P1  : 1.05398e-02 ± 6.18893e-04
  ADC_P2  : -1.35993e-05 ± 2.80794e-06
  CSA_Chi2/NDF : 8.38621e-05 / 2
  CSA_P0  : 5.71978e-02 ± 6.10809e-03
  CSA_P1  : 9.37725e-03 ± 4.60200e-04
  CSA_P2  : -3.84844e-05 ± 7.00831e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [0, 8, 12, 27, 37, 82, 92, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [34, 43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1351', '1.800', '0.1514', '1.800', '0.0891', '7.000', '0.7078', 1, 1, 1, 1, 1724887398.8432732]
VI_after__Init : ['1.201', '0.1351', '1.800', '0.1514', '1.803', '0.0837', '7.000', '0.7077', 1, 1, 1, 1, 1724887406.9538736]
VI_at__the_End : ['1.201', '0.4926', '1.800', '0.1376', '1.800', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1724887461.4287076]