TEST_NAME : Wafer
TEST_DATE : 24_08_29-01_58_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-003-08 | FUSED_ID : 6359364768388669496
  IC_TEMP : -112.49 | VDDM : 1026.89 | AUX_INT :   -2.89 | CsaBias :   25.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.58774e-04 / 2
  ADC_P0  : -2.89183e-03 ± 1.31078e-02
  ADC_P1  : 9.63773e-03 ± 4.93138e-04
  ADC_P2  : -3.95772e-06 ± 3.64567e-06
  CSA_Chi2/NDF : 1.91886e-04 / 2
  CSA_P0  : 4.55697e-01 ± 9.23941e-03
  CSA_P1  : 6.50329e-03 ± 6.96123e-04
  CSA_P2  : -6.80670e-05 ± 1.06011e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [16, 35, 69, 85, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 63, 72, 74, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.141', '0.6000', '1.800', '0.1498', '1.799', '0.0957', '7.000', '0.7075', 1, 1, 1, 1, 1724889511.2887685]
VI_after__Init : ['1.138', '0.6000', '1.800', '0.1501', '1.800', '0.0896', '7.000', '0.7074', 1, 1, 1, 1, 1724889519.3811603]
VI_at__the_End : ['1.042', '0.6000', '1.800', '0.1323', '1.800', '0.1115', '7.000', '0.7084', 1, 1, 1, 1, 1724889580.241343]