TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_01_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-005-08 | FUSED_ID : 6359364768388669528
  IC_TEMP :  -56.72 | VDDM : 1115.86 | AUX_INT :   -7.46 | CsaBias :   69.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02842e-03 / 2
  ADC_P0  : -7.45711e-03 ± 2.17352e-02
  ADC_P1  : 8.61801e-03 ± 5.57564e-04
  ADC_P2  : -5.67485e-06 ± 2.83631e-06
  CSA_Chi2/NDF : 2.04285e-04 / 2
  CSA_P0  : 5.90544e-02 ± 9.53325e-03
  CSA_P1  : 1.02791e-02 ± 7.18261e-04
  CSA_P2  : -5.41446e-05 ± 1.09383e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 28, 48, 52, 66, 67, 71, 89, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 5, 68, 97, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2138', '1.800', '0.1105', '1.800', '0.0877', '7.000', '0.7074', 1, 1, 1, 1, 1724889703.4098473]
VI_after__Init : ['1.201', '0.2137', '1.800', '0.1105', '1.800', '0.0819', '7.000', '0.7075', 1, 1, 1, 1, 1724889711.6792338]
VI_at__the_End : ['1.201', '0.4895', '1.800', '0.1383', '1.802', '0.1108', '7.000', '0.7084', 1, 1, 1, 1, 1724889766.4538872]