TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_08_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-009-08 | FUSED_ID : 6359364768388669592
  IC_TEMP :  -56.11 | VDDM : 1149.75 | AUX_INT : -213.65 | CsaBias :  -89.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.54682e-04 / 2
  ADC_P0  : -2.13648e-01 ± 2.08503e-02
  ADC_P1  : 1.14482e-02 ± 4.70986e-04
  ADC_P2  : -1.68503e-05 ± 2.08732e-06
  CSA_Chi2/NDF : 1.14115e-04 / 2
  CSA_P0  : 5.89559e-02 ± 7.12515e-03
  CSA_P1  : 9.94061e-03 ± 5.36829e-04
  CSA_P2  : -4.76548e-05 ± 8.17527e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [0, 12, 17, 39, 72, 77, 87, 93, 96, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [1, 19, 25, 26, 27, 49, 57, 61, 88]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3274', '1.800', '0.1313', '1.800', '0.0882', '7.000', '0.7076', 1, 1, 1, 1, 1724890087.2512944]
VI_after__Init : ['1.201', '0.3272', '1.800', '0.1311', '1.800', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1724890095.36266]
VI_at__the_End : ['1.201', '0.4938', '1.800', '0.1364', '1.804', '0.1106', '7.000', '0.7082', 1, 1, 1, 1, 1724890159.2616456]