TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_09_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-010-08 | FUSED_ID : 6359364768388669608
  IC_TEMP :  -51.62 | VDDM : 1138.79 | AUX_INT :   -7.94 | CsaBias :   83.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18959e-03 / 2
  ADC_P0  : -7.93568e-03 ± 2.33950e-02
  ADC_P1  : 8.33857e-03 ± 5.80486e-04
  ADC_P2  : -5.22574e-06 ± 2.86012e-06
  CSA_Chi2/NDF : 1.25323e-04 / 2
  CSA_P0  : 5.94507e-02 ± 7.46685e-03
  CSA_P1  : 9.72904e-03 ± 5.62573e-04
  CSA_P2  : -4.39257e-05 ± 8.56732e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [24, 36, 42, 59]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [39, 43, 45, 70, 81, 106, 108, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3344', '1.800', '0.1662', '1.800', '0.0859', '7.000', '0.7075', 1, 1, 1, 1, 1724890183.0258708]
VI_after__Init : ['1.201', '0.3343', '1.800', '0.1663', '1.801', '0.0803', '7.000', '0.7076', 1, 1, 1, 1, 1724890191.9351397]
VI_at__the_End : ['1.201', '0.4954', '1.800', '0.1401', '1.808', '0.1102', '7.000', '0.7085', 1, 1, 1, 1, 1724890245.967061]