TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_24_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-019-15 | FUSED_ID : 6359364768388669759
  IC_TEMP :  -54.58 | VDDM : 1125.79 | AUX_INT :   -8.15 | CsaBias :   59.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25878e-03 / 2
  ADC_P0  : -8.14539e-03 ± 2.40488e-02
  ADC_P1  : 8.54106e-03 ± 6.04005e-04
  ADC_P2  : -5.94153e-06 ± 3.00617e-06
  CSA_Chi2/NDF : 1.40820e-04 / 2
  CSA_P0  : 5.74282e-02 ± 7.91505e-03
  CSA_P1  : 1.00265e-02 ± 5.96342e-04
  CSA_P2  : -5.17755e-05 ± 9.08158e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [21, 72, 90, 100, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [18, 34, 44]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3027', '1.800', '0.1491', '1.800', '0.0842', '7.000', '0.7069', 1, 1, 1, 1, 1724891048.683317]
VI_after__Init : ['1.201', '0.3027', '1.800', '0.1478', '1.800', '0.0786', '7.000', '0.7069', 1, 1, 1, 1, 1724891056.7847562]
VI_at__the_End : ['1.201', '0.4810', '1.800', '0.1372', '1.800', '0.1120', '7.000', '0.7076', 1, 1, 1, 1, 1724891120.2658908]