TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_25_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-020-15 | FUSED_ID : 6359364768388669775
  IC_TEMP :  -63.03 | VDDM : 1130.44 | AUX_INT :   -7.47 | CsaBias :   53.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21375e-03 / 2
  ADC_P0  : -7.46714e-03 ± 2.36591e-02
  ADC_P1  : 8.79613e-03 ± 6.26114e-04
  ADC_P2  : -5.51198e-06 ± 3.28603e-06
  CSA_Chi2/NDF : 1.68471e-04 / 2
  CSA_P0  : 6.06270e-02 ± 8.65734e-03
  CSA_P1  : 1.03456e-02 ± 6.52268e-04
  CSA_P2  : -5.78023e-05 ± 9.93327e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 66, 72, 100, 102, 104, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [9, 60, 64, 75, 79, 103, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2241', '1.800', '0.1766', '1.800', '0.0934', '7.000', '0.7071', 1, 1, 1, 1, 1724891144.0341053]
VI_after__Init : ['1.201', '0.2240', '1.800', '0.1766', '1.800', '0.0875', '7.000', '0.7071', 1, 1, 1, 1, 1724891152.1834433]
VI_at__the_End : ['1.201', '0.4783', '1.800', '0.1404', '1.802', '0.1140', '7.000', '0.7076', 1, 1, 1, 1, 1724891207.9481273]