TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_27_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-021-15 | FUSED_ID : 6359364768388669791
  IC_TEMP :  -61.05 | VDDM : 1122.03 | AUX_INT :   -9.84 | CsaBias :   72.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.71345e-03 / 2
  ADC_P0  : -9.84295e-03 ± 2.81174e-02
  ADC_P1  : 8.33304e-03 ± 6.90337e-04
  ADC_P2  : -5.24812e-06 ± 3.38332e-06
  CSA_Chi2/NDF : 1.80352e-04 / 2
  CSA_P0  : 5.87939e-02 ± 8.95743e-03
  CSA_P1  : 1.03486e-02 ± 6.74877e-04
  CSA_P2  : -5.64676e-05 ± 1.02776e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 18, 37, 51, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [9, 27, 29, 32, 37, 56, 84, 118, 122, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1785', '1.800', '0.1755', '1.800', '0.0873', '7.000', '0.7068', 1, 1, 1, 1, 1724891239.8057363]
VI_after__Init : ['1.201', '0.1786', '1.800', '0.1755', '1.800', '0.0815', '7.000', '0.7068', 1, 1, 1, 1, 1724891247.9281075]
VI_at__the_End : ['1.201', '0.4829', '1.800', '0.1387', '1.800', '0.1143', '7.000', '0.7076', 1, 1, 1, 1, 1724891304.711668]