TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_30_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-023-15 | FUSED_ID : 6359364768388669823
  IC_TEMP :  -51.99 | VDDM : 1128.12 | AUX_INT :   -6.82 | CsaBias :   60.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00244e-03 / 2
  ADC_P0  : -6.82306e-03 ± 2.14609e-02
  ADC_P1  : 8.42388e-03 ± 5.40085e-04
  ADC_P2  : -5.41489e-06 ± 2.68798e-06
  CSA_Chi2/NDF : 1.25368e-04 / 2
  CSA_P0  : 5.92471e-02 ± 7.46821e-03
  CSA_P1  : 1.01459e-02 ± 5.62676e-04
  CSA_P2  : -4.96799e-05 ± 8.56889e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 8, 36, 40, 46, 48, 102, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [58, 78, 88, 120, 125, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1936', '1.800', '0.1269', '1.800', '0.0845', '7.000', '0.7069', 1, 1, 1, 1, 1724891431.7821176]
VI_after__Init : ['1.201', '0.1936', '1.800', '0.1269', '1.800', '0.0791', '7.000', '0.7068', 1, 1, 1, 1, 1724891439.7913756]
VI_at__the_End : ['1.201', '0.4972', '1.800', '0.1378', '1.800', '0.1104', '7.000', '0.7077', 1, 1, 1, 1, 1724891496.7309992]