TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_32_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-014-024-15 | FUSED_ID : 6359364768388669839
  IC_TEMP :  -57.05 | VDDM : 1115.59 | AUX_INT :   -9.85 | CsaBias :   71.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65590e-03 / 2
  ADC_P0  : -9.85470e-03 ± 2.76306e-02
  ADC_P1  : 8.17736e-03 ± 6.64682e-04
  ADC_P2  : -5.08649e-06 ± 3.19270e-06
  CSA_Chi2/NDF : 1.60864e-04 / 2
  CSA_P0  : 5.76002e-02 ± 8.45963e-03
  CSA_P1  : 9.99740e-03 ± 6.37372e-04
  CSA_P2  : -5.04817e-05 ± 9.70642e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [40, 55, 63, 95, 105, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [4, 37, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4224', '1.800', '0.1553', '1.800', '0.1017', '7.000', '0.7071', 1, 1, 1, 1, 1724891527.9446914]
VI_after__Init : ['1.201', '0.4224', '1.800', '0.1556', '1.800', '0.0959', '7.000', '0.7069', 1, 1, 1, 1, 1724891536.09899]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1335', '1.800', '0.1114', '7.000', '0.7077', 1, 1, 1, 1, 1724891592.3656046]