TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_10_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-004-05 | FUSED_ID : 6359364768388673605
  IC_TEMP :  -59.33 | VDDM : 1124.19 | AUX_INT :  -10.05 | CsaBias :   70.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43510e-03 / 2
  ADC_P0  : -1.00549e-02 ± 2.56206e-02
  ADC_P1  : 8.96150e-03 ± 6.60824e-04
  ADC_P2  : -6.85807e-06 ± 3.40610e-06
  CSA_Chi2/NDF : 2.16156e-04 / 2
  CSA_P0  : 5.78047e-02 ± 9.80632e-03
  CSA_P1  : 9.98241e-03 ± 7.38835e-04
  CSA_P2  : -5.16121e-05 ± 1.12516e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [6, 11, 64, 75, 97, 100, 102, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [31, 74, 78, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1559', '1.800', '0.1020', '1.799', '0.0780', '7.000', '0.7076', 1, 1, 1, 1, 1724893837.2179694]
VI_after__Init : ['1.201', '0.1560', '1.800', '0.1020', '1.800', '0.0723', '7.000', '0.7076', 1, 1, 1, 1, 1724893845.299347]
VI_at__the_End : ['1.201', '0.4737', '1.800', '0.1374', '1.800', '0.1123', '7.000', '0.7083', 1, 1, 1, 1, 1724893900.9701605]