TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_07_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-006-05 | FUSED_ID : 6359364768388673637
  IC_TEMP :  -57.64 | VDDM : 1126.44 | AUX_INT :   -8.25 | CsaBias :   71.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62292e-03 / 2
  ADC_P0  : -8.25112e-03 ± 2.73712e-02
  ADC_P1  : 8.91088e-03 ± 7.24457e-04
  ADC_P2  : -6.12385e-06 ± 3.79821e-06
  CSA_Chi2/NDF : 1.82593e-04 / 2
  CSA_P0  : 5.95342e-02 ± 9.01289e-03
  CSA_P1  : 9.97796e-03 ± 6.79056e-04
  CSA_P2  : -4.96316e-05 ± 1.03412e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [23, 28, 63, 69, 95, 101, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 86, 107, 111, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2178', '1.800', '0.1555', '1.800', '0.0834', '7.000', '0.7076', 1, 1, 1, 1, 1724893644.7777143]
VI_after__Init : ['1.201', '0.2178', '1.800', '0.1556', '1.800', '0.0780', '7.000', '0.7077', 1, 1, 1, 1, 1724893652.8441086]
VI_at__the_End : ['1.201', '0.4839', '1.800', '0.1396', '1.800', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1724893714.8852932]