TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_04_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-008-05 | FUSED_ID : 6359364768388673669
  IC_TEMP :  -52.33 | VDDM : 1124.20 | AUX_INT :   -8.58 | CsaBias :   85.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17829e-03 / 2
  ADC_P0  : -8.57851e-03 ± 2.32660e-02
  ADC_P1  : 7.91313e-03 ± 5.45043e-04
  ADC_P2  : -4.70645e-06 ± 2.54407e-06
  CSA_Chi2/NDF : 1.22847e-04 / 2
  CSA_P0  : 5.73528e-02 ± 7.39272e-03
  CSA_P1  : 9.61213e-03 ± 5.56988e-04
  CSA_P2  : -4.50804e-05 ± 8.48227e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [7, 29, 43, 51, 65, 82, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [28, 34, 35, 38, 57, 62]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3012', '1.800', '0.1943', '1.800', '0.0905', '7.000', '0.7079', 1, 1, 1, 1, 1724893453.7073996]
VI_after__Init : ['1.202', '0.3013', '1.800', '0.1943', '1.800', '0.0852', '7.000', '0.7076', 1, 1, 1, 1, 1724893462.4456594]
VI_at__the_End : ['1.201', '0.4818', '1.800', '0.1363', '1.800', '0.1082', '7.000', '0.7085', 1, 1, 1, 1, 1724893523.0539894]