TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_02_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-009-05 | FUSED_ID : 6359364768388673685
  IC_TEMP :  -50.97 | VDDM : 1130.38 | AUX_INT :   -9.47 | CsaBias :   66.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54456e-03 / 2
  ADC_P0  : -9.46779e-03 ± 2.66580e-02
  ADC_P1  : 8.47245e-03 ± 6.60125e-04
  ADC_P2  : -5.82315e-06 ± 3.25245e-06
  CSA_Chi2/NDF : 1.42700e-04 / 2
  CSA_P0  : 5.88043e-02 ± 7.96773e-03
  CSA_P1  : 1.00437e-02 ± 6.00311e-04
  CSA_P2  : -4.78304e-05 ± 9.14203e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 6, 18, 28, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [56, 71, 78, 90, 97, 105, 106, 114, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2763', '1.800', '0.1455', '1.800', '0.0900', '7.000', '0.7080', 1, 1, 1, 1, 1724893357.9576318]
VI_after__Init : ['1.201', '0.2764', '1.800', '0.1455', '1.800', '0.0844', '7.000', '0.7080', 1, 1, 1, 1, 1724893365.9839673]
VI_at__the_End : ['1.201', '0.4959', '1.800', '0.1412', '1.800', '0.1109', '7.000', '0.7083', 1, 1, 1, 1, 1724893421.705808]