TEST_NAME : Wafer
TEST_DATE : 24_08_29-03_01_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-010-05 | FUSED_ID : 6359364768388673701
  IC_TEMP :  -50.26 | VDDM : 1131.09 | AUX_INT :   -6.58 | CsaBias :   83.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12916e-03 / 2
  ADC_P0  : -6.57896e-03 ± 2.28203e-02
  ADC_P1  : 8.24567e-03 ± 5.70483e-04
  ADC_P2  : -4.71172e-06 ± 2.82101e-06
  CSA_Chi2/NDF : 1.14380e-04 / 2
  CSA_P0  : 5.84409e-02 ± 7.13342e-03
  CSA_P1  : 9.44088e-03 ± 5.37451e-04
  CSA_P2  : -4.03289e-05 ± 8.18475e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [19, 32, 50, 79, 92, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [65, 86, 89, 90, 112, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3993', '1.800', '0.1245', '1.800', '0.0922', '7.000', '0.7078', 1, 1, 1, 1, 1724893261.6720903]
VI_after__Init : ['1.201', '0.3994', '1.800', '0.1245', '1.800', '0.0866', '7.000', '0.7077', 1, 1, 1, 1, 1724893269.7315443]
VI_at__the_End : ['1.199', '0.4885', '1.800', '0.1405', '1.800', '0.1102', '7.000', '0.7086', 1, 1, 1, 1, 1724893332.3077042]