TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_53_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-015-05 | FUSED_ID : 6359364768388673781
  IC_TEMP :  -56.77 | VDDM : 1128.82 | AUX_INT :   -8.12 | CsaBias :   67.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08484e-03 / 2
  ADC_P0  : -8.11991e-03 ± 2.22982e-02
  ADC_P1  : 8.50749e-03 ± 5.56854e-04
  ADC_P2  : -5.88597e-06 ± 2.76104e-06
  CSA_Chi2/NDF : 1.44759e-04 / 2
  CSA_P0  : 6.13920e-02 ± 8.02500e-03
  CSA_P1  : 1.02629e-02 ± 6.04625e-04
  CSA_P2  : -5.36423e-05 ± 9.20773e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [22, 89, 107, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [62, 63, 89, 91, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2394', '1.800', '0.1729', '1.800', '0.0891', '7.000', '0.7076', 1, 1, 1, 1, 1724892780.3641107]
VI_after__Init : ['1.201', '0.2395', '1.800', '0.1728', '1.800', '0.0836', '7.000', '0.7076', 1, 1, 1, 1, 1724892788.3934934]
VI_at__the_End : ['1.202', '0.4890', '1.800', '0.1406', '1.800', '0.1129', '7.000', '0.7082', 1, 1, 1, 1, 1724892851.659657]