TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_48_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-018-02 | FUSED_ID : 6359364768388673826
  IC_TEMP :  -54.23 | VDDM : 1124.86 | AUX_INT :   -8.77 | CsaBias :   83.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46236e-03 / 2
  ADC_P0  : -8.77076e-03 ± 2.59585e-02
  ADC_P1  : 8.41771e-03 ± 6.46320e-04
  ADC_P2  : -5.43256e-06 ± 3.19954e-06
  CSA_Chi2/NDF : 1.21644e-04 / 2
  CSA_P0  : 6.01747e-02 ± 7.35645e-03
  CSA_P1  : 9.62199e-03 ± 5.54256e-04
  CSA_P2  : -4.36343e-05 ± 8.44066e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [0, 40, 42, 43, 55, 96, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 12, 18, 41, 62, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2265', '1.800', '0.1434', '1.799', '0.0884', '7.000', '0.7078', 1, 1, 1, 1, 1724892491.0173714]
VI_after__Init : ['1.201', '0.2266', '1.800', '0.1434', '1.801', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1724892499.830869]
VI_at__the_End : ['1.202', '0.4874', '1.800', '0.1379', '1.804', '0.1118', '7.000', '0.7081', 1, 1, 1, 1, 1724892561.7429638]