TEST_NAME : Wafer
TEST_DATE : 24_08_29-02_43_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-015-015-021-02 | FUSED_ID : 6359364768388673874
  IC_TEMP :  -48.37 | VDDM : 1128.51 | AUX_INT :   -6.98 | CsaBias :   75.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85288e-04 / 2
  ADC_P0  : -6.97606e-03 ± 2.12688e-02
  ADC_P1  : 8.27656e-03 ± 5.24193e-04
  ADC_P2  : -5.30418e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 9.86292e-05 / 2
  CSA_P0  : 6.17977e-02 ± 6.62407e-03
  CSA_P1  : 9.64432e-03 ± 4.99076e-04
  CSA_P2  : -4.24778e-05 ± 7.60034e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 44, 62, 77, 94, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [42, 44, 46, 52, 55, 72, 90, 92, 94, 95, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1198', '1.800', '0.1507', '1.800', '0.0813', '7.000', '0.7076', 1, 1, 1, 1, 1724892202.3436165]
VI_after__Init : ['1.202', '0.1198', '1.800', '0.1507', '1.800', '0.0761', '7.000', '0.7075', 1, 1, 1, 1, 1724892210.3359728]
VI_at__the_End : ['1.201', '0.4952', '1.800', '0.1384', '1.799', '0.1093', '7.000', '0.7083', 1, 1, 1, 1, 1724892273.5630534]